This is the world's first dedicated Hitachi Scanning TEM with a cold field emission source and an aberration corrector, specializing on high resolution STEM and Electron Energy Loss Spectroscopy (EELS) analysis.

Features:
200kV, cold FEG source
Spatial resolution : 0.09nm
Energy resolution : 0.4eV
Beam current : 100pA at 0.15nm probe size
Delivery : May 2007